QUALITY CONTROL
Experts
- Paulo Leitão
- George Q. Huang
- Frank Elberzhager
- Stefan Biffl
- Bhim Singh
- Birgit Vogel-Heuser
- Pingyu Jiang
- José Barata
- Fei Tao
- MengChu Zhou
- Alexandre Dolgui
- Lin Zhang
- Jingshan Li
- Thorsten Wuest
- Theodor Borangiu
- David Romero
- Ozgur Sinanoglu
- Yihai He
- Yehoshua Perl
- Ning Xi
- Dimitris Kiritsis
- Xun Xu
- Johann Knechtel
- Marco Taisch
- Damien Trentesaux
- Lihui Wang
- Weiming Shen
- Lei Wang
- Yiyong Yao
- Ershun Pan
- James Geller
- Dawn M. Tilbury
- Louis Raymond
- Foivos Psarommatis
- Mohammed Ashraf
- Naiqi Wu
- Silviu Raileanu
- Stefan Wagner
- Satwik Patnaik
Venues
- CoRR
- Sensors
- WSC
- IEEE Access
- Comput. Ind. Eng.
- Int. J. Comput. Integr. Manuf.
- J. Intell. Manuf.
- Int. J. Prod. Res.
- Eur. J. Oper. Res.
- ICRA
- CASE
- ETFA
- Comput. Ind.
- Expert Syst. Appl.
- Remote. Sens.
- Int. J. Manuf. Technol. Manag.
- IEEM
- Reliab. Eng. Syst. Saf.
- ITC
- IEEE Trans. Instrum. Meas.
- Comput. Electron. Agric.
- SMC
- Bioinform.
- Comput. Chem. Eng.
- APMS (1)
- IROS
- Ind. Manag. Data Syst.
- APMS (2)
- IEEE Trans Autom. Sci. Eng.
- APMS
- Comput. Aided Des.
- Oper. Res.
- IECON
- Qual. Reliab. Eng. Int.
- Int. J. Autom. Technol.
- IEEE Trans. Ind. Informatics
- Manag. Sci.
- INDIN
- Ann. Oper. Res.
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