Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration.
Shao-Chun HungArjun ChaudhuriSanmitra BanerjeeKrishnendu ChakrabartyPublished in: ITC (2022)
Keyphrases
- fault diagnosis
- random access memory
- expert systems
- fault detection
- neural network
- fault detection and diagnosis
- multiple faults
- bp neural network
- gas turbine
- electronic equipment
- chemical process
- analog circuits
- operating conditions
- fuzzy logic
- rotating machinery
- monitoring and fault diagnosis
- condition monitoring
- power transformers
- multi sensor information fusion
- low voltage
- power plant
- design considerations
- integrated circuit
- data structure