ELECTRONIC EQUIPMENT
Experts
- Jong-Myon Kim
- Zhongkui Zhu
- Ruqiang Yan
- Xuefeng Chen
- Krishnendu Chakrabarty
- Changqing Shen
- Weihua Li
- Silvio Simani
- Marios M. Polycarpou
- Chuan Li
- Janusz Rajski
- Krishna R. Pattipati
- Haidong Shao
- Weiguo Huang
- Xingxing Jiang
- Hongxia Pan
- Fengshou Gu
- Mourad Elhadef
- Irith Pomeranz
- Khashayar Khorasani
- Pabitra Mohan Khilar
- Michael G. Pecht
- Sudhakar M. Reddy
- Zhaobo Zhang
- Orestes Llanes-Santiago
- René-Vinicio Sánchez
- Xinli Gu
- Vicenç Puig
- Thomas Parisini
- Haiyang Pan
- Zhibin Zhao
- Zhijian Wang
- Yigang He
- Andrew D. Ball
- Bin Jiang
- Jinrui Wang
- Jing Lin
- Ruyi Huang
- Lei Shu
Venues
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Sensors
- IEEE Trans. Ind. Electron.
- CoRR
- Expert Syst. Appl.
- IEEE Trans. Ind. Informatics
- Neurocomputing
- Entropy
- ACC
- Eng. Appl. Artif. Intell.
- Reliab. Eng. Syst. Saf.
- IECON
- Knowl. Based Syst.
- CDC
- ECC
- J. Intell. Fuzzy Syst.
- Autom.
- IEEE Trans. Computers
- ITC
- Neural Comput. Appl.
- Appl. Soft Comput.
- CAA SAFEPROCESS
- ICPHM
- SMC
- Appl. Intell.
- I2MTC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- SAFEPROCESS
- J. Intell. Manuf.
- IJCNN
- Asian Test Symposium
- CASE
- Comput. Chem. Eng.
- ICAC
- Adv. Eng. Informatics
- ICNC
- J. Electron. Test.
- Inf. Sci.
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