FAULT DETECTION AND DIAGNOSIS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Jong-Myon Kim
- Khashayar Khorasani
- Steven X. Ding
- Mohamed N. Nounou
- Majdi Mansouri
- Hazem N. Nounou
- Bin Jiang
- Krishnendu Chakrabarty
- Xuefeng Chen
- Ruqiang Yan
- Hiroshi Takahashi
- Marios M. Polycarpou
- Silvio Simani
- Fengshou Gu
- Mehrdad Saif
- Zhongkui Zhu
- Nader Meskin
- Andrew D. Ball
- Weihua Li
- Krishna R. Pattipati
- Thomas Parisini
- Jose A. Antonino-Daviu
- Chuan Li
- Janusz Rajski
- Changqing Shen
- Haidong Shao
- Donghua Zhou
- Vicenç Puig
- Pabitra Mohan Khilar
- Shen Yin
- Yuzo Takamatsu
- Xiao He
- Guang-Hong Yang
- Yigang He
- Mourad Elhadef
- Maiying Zhong
- Demba Diallo
Venues
- IEEE Access
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Ind. Electron.
- Sensors
- CoRR
- ACC
- IECON
- IEEE Trans. Ind. Informatics
- Expert Syst. Appl.
- CDC
- IEEE Trans. Computers
- ECC
- Neurocomputing
- Autom.
- Entropy
- ITC
- Eng. Appl. Artif. Intell.
- IEEE Trans. Autom. Control.
- SMC
- Reliab. Eng. Syst. Saf.
- IEEE Trans. Control. Syst. Technol.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- CAA SAFEPROCESS
- Comput. Chem. Eng.
- IAS
- J. Frankl. Inst.
- Appl. Soft Comput.
- Int. J. Syst. Sci.
- Knowl. Based Syst.
- VTS
- Asian Test Symposium
- I2MTC
- J. Electron. Test.
- Neural Comput. Appl.
- ICPHM
- J. Intell. Fuzzy Syst.
- IJCNN
- CASE
- ISIE
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