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- Jong-Myon Kim
- Xuefeng Chen
- Zhongkui Zhu
- Ruqiang Yan
- Silvio Simani
- Weihua Li
- Marios M. Polycarpou
- Krishnendu Chakrabarty
- Khashayar Khorasani
- Krishna R. Pattipati
- Changqing Shen
- Chuan Li
- Haidong Shao
- Janusz Rajski
- Fengshou Gu
- Bin Jiang
- Weiguo Huang
- Xingxing Jiang
- Flávio Miguel Varejão
- Haiyang Pan
- Irith Pomeranz
- Yigang He
- Mourad Elhadef
- Orestes Llanes-Santiago
- Mehrdad Saif
- Thomas Parisini
- Andrew D. Ball
- Zhibin Zhao
- Sudhakar M. Reddy
- Ruyi Huang
- René-Vinicio Sánchez
- Vicenç Puig
- Jie Zhang
- Michael G. Pecht
- Pabitra Mohan Khilar
- Jinrui Wang
- Zhaobo Zhang
- Zhuyun Chen
- Xinli Gu
Venues
- IEEE Trans. Instrum. Meas.
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- Entropy
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- Adv. Eng. Informatics
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- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Asian Test Symposium
- CASE
- J. Electron. Test.
- J. Intell. Manuf.
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