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Built-In Self-Test of High-Density and Realistic ILV Layouts in Monolithic 3-D ICs.
Arjun Chaudhuri
Sanmitra Banerjee
Jinwoo Kim
Sung Kyu Lim
Krishnendu Chakrabarty
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2023)
Keyphrases
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high density
built in self test
low density
high power
close proximity
data center
thin film
real life
high bandwidth
magnetic recording
integrated circuit
real world
real time
decision trees
genetic algorithm
neural network
databases