Analysis and Characterization of Defects in FeFETs.

Dhruv Thapar Simon Thomann Arjun Chaudhuri Hussam Amrouch Krishnendu Chakrabarty

Published in: ITC (2023)

Keyphrases

statistical analysis
machine vision
multiscale
data analysis
real time
neural network
machine learning
artificial intelligence
social networks
computer vision
e learning
multi agent
information technology
mobile devices
medical images