MACHINE VISION
Experts
- Cheng-Lin Liu
- Masaki Nakagawa
- Mita Nasipuri
- Umapada Pal
- Ram Sarkar
- Seiichi Uchida
- Ching Y. Suen
- Lianwen Jin
- Nibaran Das
- Xiaoqing Ding
- Mahantapas Kundu
- Venu Govindaraju
- Horst Bunke
- Jürgen Teich
- Subhadip Basu
- Adel M. Alimi
- Sargur N. Srihari
- Masatoshi Ishikawa
- Kaushik Roy
- Swapan K. Parui
- Frank Hannig
- Adnan Amin
- Nabarun Bhattacharyya
- Bipan Tudu
- Ujjwal Bhattacharya
- Rajib Bandyopadhyay
- Kea-Tiong Tang
- Fumitaka Kimura
- Kazuhiko Yamamoto
- Changsong Liu
- B. B. Chaudhuri
- Teerakiat Kerdcharoen
- Chew Lim Tan
- Norihiro Hagita
- Malayappan Shridhar
- Rubén Usamentiaga
- Laurence Likforman-Sulem
- Satoshi Naoi
- Hsi-Jian Lee
Venues
- CoRR
- Sensors
- ICDAR
- IEEE Access
- Pattern Recognit.
- IEEE Trans. Instrum. Meas.
- ICASSP
- ICPR
- MVA
- ISCAS
- ICRA
- ICIP
- Remote. Sens.
- IGARSS
- Pattern Recognit. Lett.
- IROS
- Multim. Tools Appl.
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Electron. Agric.
- ICFHR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Int. J. Pattern Recognit. Artif. Intell.
- J. Electronic Imaging
- OFC
- Image Vis. Comput.
- Bioinform.
- BMVC
- IEEE Trans. Image Process.
- Mach. Vis. Appl.
- SMC
- IEEE J. Solid State Circuits
- ICPR (2)
- Expert Syst. Appl.
- IJCNN
- IEEE Trans. Ind. Electron.
- Proc. IEEE
- EMBC
- Comput. Ind.
- Int. J. Document Anal. Recognit.
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