Automatic Structural Test Generation for Analog Circuits using Neural Twins.

Jonti Talukdar Arjun Chaudhuri Mayukh Bhattacharya Krishnendu Chakrabarty

Published in: ITC (2022)

Keyphrases

test generation
analog circuits
test cases
neural network
fault diagnosis
digital circuits
test sequences
symbolic execution
static analysis
design automation
quality assurance
software testing
real time
error rate
knowledge acquisition
low cost
software engineering
high level
artificial intelligence
databases