David Abercrombie

Publication Activity (10 Years)

Years Active: 1997-2010
Publications (10 Years): 0

Publications

John Ferguson, Sandeep Koranne, David Abercrombie
An innovative method to automate the waiver of IP-level DRC violations. ISQED (2010)
David Abercrombie, Fedor Pikus, Cosmin Cazan
Use of lithography simulation for the calibration of equation-based design rule checks. DAC (2009)
Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC (2008)
Karen Chow, David Abercrombie, Mark Basel
Method for Managing Electromigration in SOC'S When Designing for Both Reliability and Manufacturing. SoCC (2006)
David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman
DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. VLSI Design (2006)
Jay Jahangiri, David Abercrombie
Meeting Nanometer DPM Requirements Through DFT. ISQED (2005)
Jay Jahangiri, David Abercrombie
Value-Added Defect Testing Techniques. IEEE Des. Test Comput. 22 (3) (2005)
Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw
ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. ITC (2004)
Thaddeus T. Shannon, David Abercrombie, James McNames
Process monitoring via independent components. SMC (2003)
James McNames, David Abercrombie, David Turner, Thaddeus T. Shannon
Semiconductor manufacturing process visualization. SMC (2003)
David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge
Isolating and Removing Sources of Variation in Test Data. ITC (2002)
David Abercrombie, Guy G. Gable
Industry-Government Collaboration: Queensland 's IT&T Strategy and the Information Industries Board. PACIS (1997)