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DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield.
David Abercrombie
Bernd Koenemann
Nagesh Tamarapalli
Srikanth Venkataraman
Published in:
VLSI Design (2006)
Keyphrases
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fault diagnosis
frequency domain
life cycle
medical diagnosis
model based diagnosis
high speed
low cost
discrete fourier transform
model based reasoning
high density
multiple faults
product development
product design
feedback loop
fault detection
automatic diagnosis
medical images