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Bernd Koenemann
Publication Activity (10 Years)
Years Active: 1996-2006
Publications (10 Years): 0
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Publications
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David Abercrombie
,
Bernd Koenemann
,
Nagesh Tamarapalli
,
Srikanth Venkataraman
DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield.
VLSI Design
(2006)
Bernd Koenemann
Design/process learning from electrical test.
ICCAD
(2004)
Bernd Koenemann
Test In the Era of "What You see Is NOT What You Get".
ITC
(2004)
Bernd Koenemann
STAGE: A Decoding Engine Suitable for Multi-Compressed Test Data.
Asian Test Symposium
(2003)
Fidel Muradali
,
Mike Ricchetti
,
Bart Vermeulen
,
Bulent I. Dervisoglu
,
Bob Gottlieb
,
Bernd Koenemann
,
C. J. Clark
Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer?
VTS
(2002)
Bill Bottoms
,
Jim Chung
,
Bernd Koenemann
,
Glenn Shirley
,
Lisa Spainhower
Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue.
VTS
(2001)
John A. Darringer
,
Evan E. Davidson
,
David J. Hathaway
,
Bernd Koenemann
,
Mark A. Lavin
,
Joseph K. Morrell
,
Khalid Rahmat
,
Wolfgang Roesner
,
Erich C. Schanzenbach
,
Gustavo E. Téllez
,
Louise Trevillyan
EDA in IBM: past, present, and future.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
19 (12) (2000)
D. Cheung
,
Bernd Koenemann
,
S. Nishtala
,
B. West
,
D. Wu
ATE for VLSI: What Challenges Lie Ahead?
VTS
(1997)
Bernd Koenemann
,
J. Monzel
,
T. Powell
,
N. Saxena
,
K. Wagner
Design Validation: Formal Verification vs. Simulation vs. Functional Testing.
VTS
(1996)
Bernd Koenemann
,
J. Monzel
,
T. Powell
,
N. Saxena
,
K. Wagner
BIST: Advantages or Limitations?
VTS
(1996)