Fidel Muradali

Publication Activity (10 Years)

Years Active: 1990-2008
Publications (10 Years): 0

Publications

Fidel Muradali, Suzanne Huh, Madhavan Swaminathan
Load-Board/PCB Noise Suppression via Electromagnetic Band Gap Power Plane Patterning. ATS (2008)
Fidel Muradali, Jochen Rivoir
Special Session: Analog Production Test. ATS (2007)
Anis Uzzaman, Fidel Muradali, Takashi Aikyo, Robert C. Aitken, Tom Jackson, Rajesh Galivanche, Takeshi Onodera
Test Roles in Diagnosis and Silicon Debug. ATS (2007)
Fidel Muradali
Practical Needs and Wants for Silicon Debug and Diagnosis. ATS (2006)
Fidel Muradali
Business constraints drive test decisions. ITC (2005)
Robert C. Aitken, Fidel Muradali
From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions. DATE (2004)
Carol Stolicny, Mustapha Slamani, Fidel Muradali, Geir Eide, Mike Li
ITC 2003 panels: Part 2. IEEE Des. Test Comput. 21 (3) (2004)
Fidel Muradali
Diagnosis in Modern Design - Just the Tip of the Iceberg. ITC (2003)
Fidel Muradali
Future ATE: Perspectives & Requirements. ITC (2003)
Fidel Muradali
The Impact of Outsourcing on Test. ITC (2002)
Adam Osseiran, William De Wilkins, Barry Baril, Sassan Tabatabaei, Fidel Muradali, Ken Posse, Lee Song
Analog and Mixed Signal BIST: Too Much, Too Little, Too Late? VTS (2002)
Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark
Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer? VTS (2002)
Chintan Patel, Fidel Muradali, James F. Plusquellic
Power supply transient signal integration circuit. ITC (2001)
Fidel Muradali, André Ivanov
Do I Need this Tool for My Chips to Work? VTS (2000)
Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali
Defect detection using power supply transient signal analysis. ITC (1999)
Robert C. Aitken, Fidel Muradali
Trends in SLI design and their effect on test. ITC (1999)
Fidel Muradali, Janusz Rajski
A self-driven test structure for pseudorandom testing of non-scan sequential circuits. VTS (1996)
Fidel Muradali, Takao Nishida, Tsuguo Shimizu
A structure and technique for pseudorandom-based testing of sequential circuits. J. Electron. Test. 6 (1) (1995)
Fidel Muradali, Vinod K. Agarwal, Benoit Nadeau-Dostie
A new procedure for weighted random built-in self-test. ITC (1990)