Defect detection using power supply transient signal analysis.
Amy GermidaZheng YanJames F. PlusquellicFidel MuradaliPublished in: ITC (1999)
Keyphrases
- defect detection
- power supply
- signal analysis
- feature extraction
- multiresolution
- signal processing
- intelligent control
- wavelet decomposition
- high frequency
- empirical mode decomposition
- adaptive learning
- median filter
- rbf neural network
- pattern recognition
- similarity measure
- computer vision
- subband
- fuzzy logic
- face recognition