Sassan Tabatabaei

Publication Activity (10 Years)

Years Active: 1997-2020
Publications (10 Years): 3

Top Topics

Phase Difference

Induction Motor

Top Venues

IEEE J. Solid State Circuits

Publications

Saleh Heidary Shalmany, Kamran Souri, Uaur Sonmez, Kianoush Souri, Michele D'Urbino, Said Hussaini, Darryl Tauro, Sassan Tabatabaei
. ISSCC (2020)
Meisam Heidarpour Roshan, Samira Zaliasl, Kimo Joo, Kamran Souri, Rajkumar Palwai, Lijun Will Chen, Amanpreet Singh, Sudhakar Pamarti, Nicholas Miller, Joseph C. Doll, Carl Arft, Sassan Tabatabaei, Carl Sechen, Aaron Partridge, Vinod Menon
A MEMS-Assisted Temperature Sensor With 20-µK Resolution, Conversion Rate of 200 S/s, and FOM of 0.04 pJK2. IEEE J. Solid State Circuits 52 (1) (2017)
Meisam Heidarpour Roshan, Samira Zali Asl, Kimo Joo, Kamran Souri, Rajkumar Palwai, Lijun Will Chen, Sudhakar Pamarti, Joseph C. Doll, Nicholas Miller, Carl Arft, Sassan Tabatabaei, Carl Sechen, Aaron Partridge, Vinod Menon
11.1 Dual-MEMS-resonator temperature-to-digital converter with 40 K resolution and FOM of 0.12pJK2. ISSCC (2016)
Michael H. Perrott, James C. Salvia, Fred S. Lee, Aaron Partridge, Shouvik Mukherjee, Carl Arft, Jin-Tae Kim, Niveditha Arumugam, Pavan Gupta, Sassan Tabatabaei, Sudhakar Pamarti, Haechang Lee, Fari Assaderaghi
A Temperature-to-Digital Converter for a MEMS-Based Programmable Oscillator With < ±0.5-ppm Frequency Stability and < 1-ps Integrated Jitter. IEEE J. Solid State Circuits 48 (1) (2013)
Michael H. Perrott, Jim Salvia, Fred S. Lee, Aaron Partridge, Shouvik Mukherjee, Carl Arft, Jin-Tae Kim, Niveditha Arumugam, Pavan Gupta, Sassan Tabatabaei, Sudhakar Pamarti, Haechang Lee, Fari Assaderaghi
A temperature-to-digital converter for a MEMS-based programmable oscillator with better than ±0.5ppm frequency stability. ISSCC (2012)
Sassan Tabatabaei, Aaron Partridge
Silicon MEMS Oscillators for High-Speed Digital Systems. IEEE Micro 30 (2) (2010)
Aaron Partridge, Sassan Tabatabaei
Silicon MEMS oscillators for high speed digital systems. Hot Chips Symposium (2009)
A. K. M. K. Mollah, Roberto Rosales, Sassan Tabatabaei, James Cicalo, André Ivanov
Design of a Tunable Differential Ring Oscillator With Short Start-Up and Switching Transients. IEEE Trans. Circuits Syst. I Regul. Pap. (12) (2007)
Baosheng Wang, Andy Kuo, Touraj Farahmand, André Ivanov, Yong B. Cho, Sassan Tabatabaei
A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices. J. Electron. Test. 21 (6) (2005)
Sassan Tabatabaei, Freddy Ben-Zeev, Touraj Farahmand
Jitter spectrum analysis using continuous time interval analyzer (CTIA). ITC (2005)
Andy Kuo, Roberto Rosales, Touraj Farahmand, Sassan Tabatabaei, André Ivanov
Crosstalk bounded uncorrelated jitter (BUJ) for high-speed interconnects. IEEE Trans. Instrum. Meas. 54 (5) (2005)
Touraj Farahmand, Sassan Tabatabaei, Freddy Ben-Zeev, André Ivanov
A DDJ calibration methodology for high-speed test and measurement equipments. ITC (2005)
Andy Kuo, Touraj Farahmand, Nelson Ou, André Ivanov, Sassan Tabatabaei
Jitter Models and Measurement Methods for High-Speed Serial Interconnects. ITC (2004)
Nelson Ou, Touraj Farahmand, Andy Kuo, Sassan Tabatabaei, André Ivanov
Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects. IEEE Des. Test Comput. 21 (4) (2004)
Sassan Tabatabaei, Michael Lee, Freddy Ben-Zeev
Jitter Generation and Measurement for Test of Multigbps Serial IO. ITC (2004)
Baosheng Wang, Yong B. Cho, Sassan Tabatabaei, André Ivanov
Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-Offs for High-Speed Interconnect Device Testing. Asian Test Symposium (2003)
Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei
An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Des. Test Comput. 20 (1) (2003)
Sassan Tabatabaei, André Ivanov
Embedded Timing Analysis: A SoC Infrastructure. IEEE Des. Test Comput. 19 (3) (2002)
Karim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei
Multi-GigaHertz Testing Challenges and Solutions. VTS (2002)
Adam Osseiran, William De Wilkins, Barry Baril, Sassan Tabatabaei, Fidel Muradali, Ken Posse, Lee Song
Analog and Mixed Signal BIST: Too Much, Too Little, Too Late? VTS (2002)
Sassan Tabatabaei, André Ivanov
An Embedded Core for Sub-Picosecond Timing Measurements. ITC (2002)
Min-Hsing P. Chen, André Ivanov, Sassan Tabatabaei
Defect Oriented Testing of an ECL/CMOS Level Converter Circuit. LATW (2000)
Sassan Tabatabaei, André Ivanov
A built-in current monitor for testing analog circuit blocks. ISCAS (2) (1999)
Sassan Tabatabaei, André Ivanov
A Current Integrator for BIST of Mixed-Signal ICs. VTS (1999)
Sumbal Rafiq, André Ivanov, Sassan Tabatabaei, Michel Renovell
Testing for Floating Gates Defects in CMOS Circuits. Asian Test Symposium (1998)
Maneesha Dalmia, André Ivanov, Sassan Tabatabaei
Power supply current monitoring techniques for testing PLLs. Asian Test Symposium (1997)