Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-Offs for High-Speed Interconnect Device Testing.
Baosheng WangYong B. ChoSassan TabatabaeiAndré IvanovPublished in: Asian Test Symposium (2003)
Keyphrases
- high speed
- trade off
- data acquisition
- test cases
- software testing
- real time
- test data
- test generation
- classification accuracy
- high accuracy
- higher level
- test sequences
- prediction accuracy
- frame rate
- low power
- complex environments
- usability testing
- testing process
- set of test cases
- test suite
- data sets
- levels of abstraction
- statistical tests
- error rate
- mobile robot
- training data
- computational efficiency
- fold cross validation
- virtual world
- defect detection
- video sequences
- decision trees