SET OF TEST CASES
Experts
- Tsong Yueh Chen
- Gregg Rothermel
- Lionel C. Briand
- Matteo Sonza Reorda
- T. H. Tse
- Dave Towey
- Jinfu Chen
- W. K. Chan
- Rubing Huang
- Zhenyu Chen
- Bo Jiang
- Atif M. Memon
- Mark Harman
- Ernesto Sánchez
- Giovanni Squillero
- Lingming Zhang
- Dimitris Gizopoulos
- Robert M. Hierons
- Dan Hao
- Gordon Fraser
- Robert Feldt
- Hyunsook Do
- Franz Wotawa
- Yves Le Traon
- Lu Zhang
- Antonis M. Paschalis
- Fei-Ching Kuo
- Arnaud Gotlieb
- Wasif Afzal
- Antonia Bertolino
- Dusica Marijan
- Chunrong Fang
- Mary Jean Harrold
- Shaukat Ali
- Tao Yue
- Hadi Hemmati
- Nina Yevtushenko
- Paolo Tonella
- Shin Yoo
Venues
- CoRR
- ICST
- ITC
- ICST Workshops
- Inf. Softw. Technol.
- IEEE Trans. Software Eng.
- ISSTA
- J. Syst. Softw.
- ICSE
- ASE
- SEKE
- Softw. Test. Verification Reliab.
- ACM SIGSOFT Softw. Eng. Notes
- ISSRE
- IEEE Access
- COMPSAC
- AST
- ESEC/SIGSOFT FSE
- QSIC
- Softw. Qual. J.
- ACM Trans. Softw. Eng. Methodol.
- QRS
- Empir. Softw. Eng.
- APSEC
- ICTSS
- QRS Companion
- ICSME
- SAC
- Int. J. Softw. Eng. Knowl. Eng.
- ISSRE Workshops
- J. Softw.
- COMPSAC (1)
- SSBSE
- ETS
- VTS
- 计算机科学
- DATE
- Asian Test Symposium
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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