SET OF TEST CASES
Experts
- Tsong Yueh Chen
- Gregg Rothermel
- Lionel C. Briand
- Matteo Sonza Reorda
- Dave Towey
- T. H. Tse
- Jinfu Chen
- Rubing Huang
- W. K. Chan
- Bo Jiang
- Atif M. Memon
- Zhenyu Chen
- Mark Harman
- Giovanni Squillero
- Ernesto Sánchez
- Yves Le Traon
- Lu Zhang
- Dimitris Gizopoulos
- Hyunsook Do
- Franz Wotawa
- Dan Hao
- Lingming Zhang
- Robert M. Hierons
- Gordon Fraser
- Robert Feldt
- Shaukat Ali
- Nina Yevtushenko
- Dusica Marijan
- Antonis M. Paschalis
- Fei-Ching Kuo
- Chunrong Fang
- Mary Jean Harrold
- Tao Yue
- Wasif Afzal
- Arnaud Gotlieb
- Antonia Bertolino
- Hadi Hemmati
- Fabrizio Pastore
- Akbar Siami Namin
Venues
- CoRR
- ICST
- ITC
- ICST Workshops
- Inf. Softw. Technol.
- ISSTA
- IEEE Trans. Software Eng.
- J. Syst. Softw.
- ICSE
- ASE
- SEKE
- Softw. Test. Verification Reliab.
- ACM SIGSOFT Softw. Eng. Notes
- IEEE Access
- ISSRE
- AST
- COMPSAC
- QSIC
- ESEC/SIGSOFT FSE
- Softw. Qual. J.
- ACM Trans. Softw. Eng. Methodol.
- QRS
- Empir. Softw. Eng.
- ICTSS
- APSEC
- QRS Companion
- COMPSAC (1)
- SAC
- ISSRE Workshops
- ICSME
- J. Softw.
- Int. J. Softw. Eng. Knowl. Eng.
- SSBSE
- ETS
- VTS
- 计算机科学
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- DATE
- Asian Test Symposium
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