TESTING PROCESS
Experts
- Tsong Yueh Chen
- Gordon Fraser
- Lionel C. Briand
- Gregg Rothermel
- Krishnendu Chakrabarty
- Vahid Garousi
- Robert M. Hierons
- T. H. Tse
- Mark Harman
- Atif M. Memon
- Andrea Arcuri
- Kai-Yuan Cai
- Antonia Bertolino
- José Carlos Maldonado
- Tao Xie
- Michael Felderer
- W. K. Chan
- Rudolf Ramler
- Dave Towey
- Yves Le Traon
- Jinfu Chen
- Matteo Sonza Reorda
- Zhenyu Chen
- Bernhard K. Aichernig
- Andy Zaidman
- Arnaud Gotlieb
- Hyunsook Do
- Luiz Fernando Capretz
- Hong Zhu
- Baowen Xu
- Wasif Afzal
- Jeff Offutt
- Paolo Tonella
- Inmaculada Medina-Bulo
- Mary Jean Harrold
- Bruno Legeard
- Robert Feldt
- Dan Hao
- Song Huang
Venues
- CoRR
- ICST
- ITC
- ICST Workshops
- Softw. Test. Verification Reliab.
- IEEE Trans. Software Eng.
- J. Syst. Softw.
- Inf. Softw. Technol.
- ICSE
- ISSTA
- COMPSAC
- ASE
- ACM SIGSOFT Softw. Eng. Notes
- Softw. Qual. J.
- ISSRE
- SEKE
- QSIC
- ESEC/SIGSOFT FSE
- AST
- Asian Test Symposium
- SAC
- IEEE Access
- Empir. Softw. Eng.
- ACM Trans. Softw. Eng. Methodol.
- ICSM
- IEEE Softw.
- Int. J. Softw. Eng. Knowl. Eng.
- VTS
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- DATE
- AST@ICSE
- QRS Companion
- APSEC
- SBES
- ICTSS
- J. Electron. Test.
- ISSRE Workshops
- SAST
- J. Softw.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend