Testing for Floating Gates Defects in CMOS Circuits.
Sumbal RafiqAndré IvanovSassan TabatabaeiMichel RenovellPublished in: Asian Test Symposium (1998)
Keyphrases
- analog vlsi
- delay insensitive
- logic circuits
- circuit design
- vlsi circuits
- high speed
- low power
- low cost
- cmos technology
- power consumption
- random access memory
- power dissipation
- floating gate
- focal plane
- defect detection
- test set
- neural network
- software development life cycle
- mixed signal
- image sensor
- test data
- test cases
- defect classification