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An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs.

Florence AzaïsYves BertrandMichel RenovellAndré IvanovSassan Tabatabaei
Published in: IEEE Des. Test Comput. (2003)
Keyphrases
  • test cases
  • frequency domain
  • fault diagnosis
  • recognition scheme
  • secret sharing scheme
  • data sets
  • fault model
  • database
  • learning scheme
  • detection scheme
  • discrete fourier transform
  • test sequences