Jochen Rivoir

Publication Activity (10 Years)

Years Active: 2001-2022
Publications (10 Years): 8

Top Topics

Pointwise Mutual Information

Feature Selection

Silicon Dioxide

Top Venues

Publications

Yiwen Liao, Jochen Rivoir, Raphaël Latty, Bin Yang
Deep Feature Selection Using a Novel Complementary Feature Mask. CoRR (2022)
Hussam Amrouch, Jens Anders, Steffen Becker, Maik Betka, Gerd Bleher, Peter Domanski, Nourhan Elhamawy, Thomas Ertl, Athanasios Gatzastras, Paul R. Genssler, Sebastian Hasler, Martin Heinrich, André van Hoorn, Hanieh Jafarzadeh, Ingmar Kallfass, Florian Klemme, Steffen Koch, Ralf Küsters, Andrés Lalama, Raphael Latty, Yiwen Liao, Natalia Lylina, Zahra Paria Najafi-Haghi, Dirk Pflüger, Ilia Polian, Jochen Rivoir, Matthias Sauer, Denis Schwachhofer, Steffen Templin, Christian Volmer, Stefan Wagner, Daniel Weiskopf, Hans-Joachim Wunderlich, Bin Yang, Martin Zimmermann
Intelligent Methods for Test and Reliability. DATE (2022)
Yiwen Liao, Bin Yang, Raphaël Latty, Jochen Rivoir
A Deep-Learning-Aided Pipeline for Efficient Post-Silicon Tuning. CoRR (2022)
Peter Domanski, Dirk Pflüger, Raphaël Latty, Jochen Rivoir
ORSA: Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems. ICMLA (2021)
Peter Domanski, Dirk Pflüger, Jochen Rivoir, Raphaël Latty
Self-Learning Tuning for Post-Silicon Validation. CoRR (2021)
Peter Domanski, Dirk Pflüger, Jochen Rivoir, Raphaël Latty
ORSA: Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems\. CoRR (2021)
Ghada Sokar, Yassien Zakaria, Asmaa Rabie, Kareem Madkour, Ira Leventhal, Jochen Rivoir, Xinli Gu, Haralampos-G. D. Stratigopoulos
IP Session on Machine Learning Applications in IC Test-Related Tasks. VTS (2019)
Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker, Matthias Sauer
Efficient generation of parametric test conditions for AMS chips with an interval constraint solver. VTS (2018)
Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir
A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources. J. Electron. Test. 27 (3) (2011)
Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir
On the use of standard digital ATE for the analysis of RF signals. ETS (2010)
Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir
Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels. LATW (2010)
Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir
Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE. Asian Test Symposium (2009)
Fidel Muradali, Jochen Rivoir
Special Session: Analog Production Test. ATS (2007)
Jochen Rivoir
Fast and Low Cost HW Bit Map for Memory Test Based on Residue Polynomial System over GF(2). ATS (2007)
Jochen Rivoir
Statistical Linearity Calibration of Time-To-Digital Converters Using a Free-Running Ring Oscillator. ATS (2006)
Jochen Rivoir
Fully-Digital Time-To-Digital Converter for ATE with Autonomous Calibration. ITC (2006)
Jochen Rivoir
Low-Cost Analog Signal Generation Using a Pulse-Density Modulated Digital ATE Channel. Asian Test Symposium (2004)
Jochen Rivoir
Lowering Cost of Test: Parallel Test or Low-Cost ATE? Asian Test Symposium (2003)
Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges
Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits. J. Electron. Test. 19 (2) (2003)
Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges
Test Economics for Multi-site Test with Modern Cost Reduction Techniques. VTS (2002)
Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra
Test Vector Compression Using EDA-ATE Synergies. VTS (2002)
Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir
A new methodology for improved tester utilization. ITC (2001)
Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff
Tackling test trade-offs from design, manufacturing to market using economic modeling. ITC (2001)