Ajay Khoche

Publication Activity (10 Years)

Years Active: 1992-2013
Publications (10 Years): 0

Top Topics

Application Specific

Top Venues

Publications

Alfred L. Crouch, John C. Potter, Ajay Khoche, Jennifer Dworak
FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System. IEEE Des. Test 30 (5) (2013)
Jim O'Reilly, Ajay Khoche, Ernst Wahl, Bruce R. Parnas
STIL P1450.4: A standard for test flow specification. ITC (2010)
Ajay Khoche, Jay Katz, Sauro Landini, Kochen Liao, Neetu Agrawal, Glenn Plowman, Song-lin Zuo, Liyang Lai, John Rowe, Thomas Zanon
STDF Memory Fail Datalog Standard. VTS (2009)
Ajay Khoche, Phil Burlison, John Rowe, Glenn Plowman
A Tutorial on STDF Fail Datalog Standard. ITC (2008)
Ajay Khoche, Domenico Chindamo, Michael Braun, Martin Fischer
Selective and Accurate Fail Data Capture in Compression Environment for Volume Diagnostics. ITC (2006)
Andreas Leininger, Ajay Khoche, Martin Fischer, Nagesh Tamarapalli, Wu-Tung Cheng, Randy Klingenberg, Wu Yang
The Next Step in Volume Scan Diagnosis: Standard Fail Data Format. ATS (2006)
Ajay Khoche
Session Abstract. VTS (2006)
Ajay Khoche, Mike Rodgers, Pete O'Neil
Session Abstract. VTS (2006)
Ajay Khoche, Peter Muhmenthaler
Session Abstract. VTS (2006)
Ajay Khoche
Panel Summaries: Real-Time Volume Diagnostics--Requirements and Challenges. IEEE Des. Test Comput. 23 (4) (2006)
Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges
Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits. J. Electron. Test. 19 (2) (2003)
Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges
Test Economics for Multi-site Test with Modern Cost Reduction Techniques. VTS (2002)
Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra
Test Vector Compression Using EDA-ATE Synergies. VTS (2002)
Erik H. Volkerink, Ajay Khoche, Subhasish Mitra
Packet-Based Input Test Data Compression Techniques. ITC (2002)
Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir
A new methodology for improved tester utilization. ITC (2001)
Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff
Tackling test trade-offs from design, manufacturing to market using economic modeling. ITC (2001)
Ajay Khoche, Erik Brunvand
ACT: A DFT Tool for Self-Timed Circuits. ITC (1997)
Ajay Khoche, Erik Brunvand
Critical hazard free test generation for asynchronous circuits. VTS (1997)
Ajay Khoche, Erik Brunvand
A partial scan methodology for testing self-timed circuits. VTS (1995)
Sandeep Pagey, Ajay Khoche, Erik Brunvand
DFT for fast testing of self-timed control circuits. Asian Test Symposium (1995)
Ajay Khoche, Erik Brunvand
Testing self-timed circuits using partial scan. ASYNC (1995)
Ajay Khoche, Erik Brunvand
Testing micropipelines. ASYNC (1994)
Ajay Khoche, Sunil D. Sherlekar, G. Venkatesh, Raja Venkateswaran
A Behavioral Fault Simulator for Ideal. IEEE Des. Test Comput. 9 (4) (1992)
Ajay Khoche, Sunil D. Sherlekar, G. Venkatesh
A Behavioral Fault Simulator For Ideal. VLSI Design (1992)