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A new methodology for improved tester utilization.

Ajay KhocheRohit KapurDavid ArmstrongThomas W. WilliamsMick TegethoffJochen Rivoir
Published in: ITC (2001)
Keyphrases
  • objective function
  • black box
  • neural network
  • artificial intelligence
  • similarity measure
  • feature space
  • information technology
  • design methodology