Hans G. Kerkhoff

Publication Activity (10 Years)

Years Active: 1981-2021
Publications (10 Years): 38

Top Venues

ETS

DDECS

DTIS

IOLTS

Publications

Hassan Ebrahimi, Hans G. Kerkhoff
Embedded Test Instrument for Intermittent Resistive Fault Detection at Chip Level and Its Reuse at Board Level. DDECS (2021)
Leila Bagheriye, Ghazanfar Ali, Hans G. Kerkhoff
Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. IOLTS (2020)
Ghazanfar Ali, Leila Bagheriye, Hans G. Kerkhoff
On-Chip Embedded Instruments Data Fusion and Life-Time Prognostics of Dependable VLSI-SoCs using Machine-Learning. ISCAS (2020)
Hassan Ebrahimi, Hans G. Kerkhoff
A New Monitor Insertion Algorithm for Intermittent Fault Detection. ETS (2020)
Ghazanfar Ali, Leila Bagheriye, Hans A. R. Manhaeve, Hans G. Kerkhoff
On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs. ATS (2020)
Ahmed M. Y. Ibrahim, Hans G. Kerkhoff
DARS: An EDA Framework for Reliability and Functional Safety Management of System-on-Chips. ITC (2019)
Ahmed M. Y. Ibrahim, Hans G. Kerkhoff, Abrar Ibrahim, Mona Safar, M. Watheq El-Kharashi
Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks. VTS (2019)
Ghazanfar Ali, Jerrin Pathrose, Hans G. Kerkhoff
IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time. LATS (2019)
Ghazanfar Ali, Jerrin Pathrose, Hans G. Kerkhoff
IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation. ETS (2019)
Hassan Ebrahimi, Hans G. Kerkhoff
A Digital On-Line Monitor for Detecting Intermittent Resistance Faults at Board Level. J. Circuits Syst. Comput. 28 (Supplement-1) (2019)
Jerrin Pathrose, Leon van de Logt, Hans G. Kerkhoff
Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability Applications. DFT (2019)
Ahmed M. Y. Ibrahim, Hans G. Kerkhoff
An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips. ITC-Asia (2019)
Jerrin Pathrose, Ghazanfar Ali, Hans G. Kerkhoff
IJTAG compatible analogue embedded instruments for MPSoC life-time prediction. LATS (2018)
Hassan Ebrahimi, Hans G. Kerkhoff
Intermittent Resistance Fault Detection at Board Level. DDECS (2018)
Jerrin Pathrose, Ghazanfar Ali, Hans G. Kerkhoff
Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments. APCCAS (2018)
Ghazanfar Ali, Jerrin Pathrose, Hans G. Kerkhoff
On-Chip Lifetime Prediction for Dependable Many-Processor SoCs Based on Data Fusion. MCSoC (2018)
Ghazanfar Ali, Hassan Ebrahimi, Jerrin Pathrose, Hans G. Kerkhoff
Design and implementation of a dependable CPSoC for automotive applications. ICPS (2018)
Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke
BASTION: Board and SoC test instrumentation for ageing and no failure found. DATE (2017)
Andreina Zambrano, Hans G. Kerkhoff
Improving the dependability of AMR sensors used in automotive applications. ETS (2017)
Andreina Zambrano, Hans G. Kerkhoff
A dependable AMR sensor system for automotive applications. ITC-Asia (2017)
Hans G. Kerkhoff, Ghazanfar Ali, Hassan Ebrahimi, Ahmed Ibrahim
An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability. ITC-Asia (2017)
Ahmed Ibrahim, Hans G. Kerkhoff
Structured scan patterns retargeting for dynamic instruments access. VTS (2017)
Ahmed Ibrahim, Hans G. Kerkhoff
A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. IOLTS (2017)
Hans G. Kerkhoff, Ghazanfar Ali, Jinbo Wan, Ahmed Ibrahim, Jerrin Pathrose
Applying IJTAG-compatible embedded instruments for lifetime enhancement of analog front-ends of cyber-physical systems. VLSI-SoC (2017)
Alireza Rohani, Hassan Ebrahimi, Hans G. Kerkhoff
A software framework to calculate local temperatures in CMOS processors. PATMOS (2016)
Hans G. Kerkhoff, Hassan Ebrahimi
Investigation of Intermittent Resistive Faults in Digital CMOS Circuits. J. Circuits Syst. Comput. 25 (3) (2016)
Yong Zhao, Hans G. Kerkhoff
Highly Dependable Multi-processor SoCs Employing Lifetime Prediction Based on Health Monitors. ATS (2016)
Hassan Ebrahimi, Alireza Rohani, Hans G. Kerkhoff
Detecting intermittent resistive faults in digital CMOS circuits. DFT (2016)
Ahmed Ibrahim, Hans G. Kerkhoff
Analysis and design of an on-chip retargeting engine for IEEE 1687 networks. ETS (2016)
Ghazanfar Ali, Ahmed Badawy, Hans G. Kerkhoff
Accessing on-chip temperature health monitors using the IEEE 1687 standard. ICECS (2016)
Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser
Thermal issues in test: An overview of the significant aspects and industrial practice. VTS (2016)
Andreina Zambrano, Hans G. Kerkhoff
Online monitoring of the maximum angle error in AMR sensors. IOLTS (2016)
Ahmed Ibrahim, Hans G. Kerkhoff
Efficient utilization of hierarchical iJTAG networks for interrupts management. DFT (2016)
Yong Zhao, Hans G. Kerkhoff
A genetic algorithm based remaining lifetime prediction for a VLIW processor employing path delay and IDDX testing. DTIS (2016)
Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Görschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard K. Rauwerda, Heinz Riener, Franz Röck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao
Designing reliable cyber-physical systems overview associated to the special session at FDL'16. FDL (2016)
Andreina Zambrano, Hans G. Kerkhoff
Online digital compensation Method for AMR sensors. VLSI-SoC (2016)
Ahmed Ibrahim, Hans G. Kerkhoff
Towards an automated and reusable in-field self-test solution for MPSoCs. ICM (2016)
Hassan Ebrahimi, Hans G. Kerkhoff
Testing for Intermittent Resistive Faults in CMOS Integrated Systems. DSD (2016)
Hans G. Kerkhoff, Hassan Ebrahimi
Intermittent Resistive Faults in Digital CMOS Circuits. DDECS (2015)
Yong Zhao, Hans G. Kerkhoff
Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation. DTIS (2015)
Jinbo Wan, Hans G. Kerkhoff
New drain current model for nano-meter MOS transistors on-chip threshold voltage test. ETS (2015)
Andreina Zambrano, Hans G. Kerkhoff
Online digital offset voltage compensation method for AMR sensors. I2MTC (2015)
Yong Zhao, Hans G. Kerkhoff
Unit-Based Functional IDDT Testing for Aging Degradation Monitoring in a VLIW Processor. DSD (2015)
Jinbo Wan, Hans G. Kerkhoff
Embedded instruments for enhancing dependability of analogue and mixed-signal IPs. NEWCAS (2015)
Riccardo Cantoro, Matteo Sonza Reorda, Alireza Rohani, Hans G. Kerkhoff
On the maximization of the sustained switching activity in a processor. IOLTS (2015)
Andreina Zambrano, Hans G. Kerkhoff
Fault-tolerant system for catastrophic faults in AMR sensors. IOLTS (2015)
Hans G. Kerkhoff
Day 1: Invited talk 2: Dependable mixed-signal integrated systems under aging. IDT (2014)
Ahmed Ibrahim, Hans G. Kerkhoff
iJTAG integration of complex digital embedded instruments. IDT (2014)
Hans G. Kerkhoff, Jinbo Wan, Yong Zhao
Linking aging measurements of health-monitors and specifications for multi-processor SoCs. DTIS (2014)
Alireza Rohani, Hans G. Kerkhoff
Two soft-error mitigation techniques for functional units of DSP processors. ETS (2014)
Yong Zhao, Hans G. Kerkhoff
Design of an Embedded Health Monitoring Infrastructure for Accessing Multi-processor SoC Degradation. DSD (2014)
Jinbo Wan, Hans G. Kerkhoff
An embedded offset and gain instrument for OpAmp IPs. DATE (2014)
M. A. Khan, Hans G. Kerkhoff
Studying DAC capacitor-array degradation in charge-redistribution SAR ADCs. DDECS (2014)
Muhammad Aamir Khan, Hans G. Kerkhoff
Analysing degradation effects in charge-redistribution SAR ADCs. DFTS (2013)
Shaji Krishnan, Hans G. Kerkhoff
Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses. IEEE Des. Test 30 (3) (2013)
Muhammad Aamir Khan, Hans G. Kerkhoff
Monitoring operating temperature and supply voltage in achieving high system dependability. DTIS (2013)
Muhammad Aamir Khan, Hans G. Kerkhoff
The Essence of Reliability Estimation during Operational Life for Achieving High System Dependability. DSD (2013)
Muhammad Aamir Khan, Hans G. Kerkhoff
An indirect technique for estimating reliability of analog and mixed-signal systems during operational life. DDECS (2013)
Jinbo Wan, Hans G. Kerkhoff
An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations. ISQED (2013)
Alireza Rohani, Hans G. Kerkhoff
Rapid transient fault insertion in large digital systems. Microprocess. Microsystems 37 (2) (2013)
Yong Zhao, Xiao Zhang, Hans G. Kerkhoff
Power-dissipation comparison of two dependability approaches for multi-processor systems. DTIS (2013)
Alireza Rohani, Hans G. Kerkhoff, Enrico Costenaro, Dan Alexandrescu
Pulse-length determination techniques in the rectangular single event transient fault model. ICSAMOS (2013)
Alireza Rohani, Hans G. Kerkhoff
An on-line soft error mitigation technique for control logic of VLIW processors. DFT (2012)
Benaoumeur Senouci, Anne-Johan Annema, Mark J. Bentum, Hans G. Kerkhoff
Investigating Dependability of Short-Range Wireless Embedded Systems through Hardware Platform Based Design. DSD (2012)
Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud
ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus. J. Electron. Test. 28 (4) (2012)
Hans G. Kerkhoff, Yong Zhao
The design of dependable flexible multi-sensory System-on-Chips for security applications. DDECS (2012)
Jinbo Wan, Hans G. Kerkhoff
Monitoring active filters under automotive aging scenarios with embedded instrument. DATE (2012)
Shaji Krishnan, Hans G. Kerkhoff
A robust metric for screening outliers from analogue product manufacturing tests responses. ETS (2012)
Xiao Zhang, Hans G. Kerkhoff
A Dependability Solution for Homogeneous MPSoCs. PRDC (2011)
Muhammad Aamir Khan, Hans G. Kerkhoff
A system-level platform for dependability enhancement and its analysis for mixed-signal SoCs. DDECS (2011)
Alireza Rohani, Hans G. Kerkhoff
A Technique for Accelerating Injection of Transient Faults in Complex SoCs. DSD (2011)
Jinbo Wan, Hans G. Kerkhoff
Boosted gain programmable Opamp with embedded gain monitor for dependable SoCs. ISOCC (2011)
Alireza Rohani, Hans G. Kerkhoff
Study of the effects of SET induced faults on submicron technologies. DSN Workshops (2011)
Muhammad Aamir Khan, Hans G. Kerkhoff
SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life. DFT (2011)
Shaji Krishnan, Hans G. Kerkhoff
A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. ETS (2011)
Shaji Krishnan, Klaas D. Doornbos, Rudi Brand, Hans G. Kerkhoff
Block-level bayesian diagnosis of analogue electronic circuits. DATE (2010)
Timon D. ter Braak, S. T. Burgess, H. Hurskainen, Hans G. Kerkhoff, Bart Vermeulen, Xiao Zhang
On-line dependability enhancement of multiprocessor SoCs by resource management. SoC (2010)
Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen
On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism. DSD (2010)
Xiaoqin Sheng, Hans G. Kerkhoff
The Test Ability of an Adaptive Pulse Wave for ADC Testing. Asian Test Symposium (2010)
Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen
New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism. ETS (2010)
Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff
Predicting dynamic specifications of ADCs with a low-quality digital input signal. ETS (2010)
Shaji Krishnan, Hans G. Kerkhoff
Multivariate model for test response analysis. ETS (2010)
Hans G. Kerkhoff, Xiao Zhang
Design of an Infrastructural IP Dependability Manager for a Dependable Reconfigurable Many-Core Processor. DELTA (2010)
Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud
Algorithms for ADC Multi-site Test with Digital Input Stimulus. ETS (2009)
Xiao Zhang, Hans G. Kerkhoff
Design of a Highly Dependable Beamforming Chip. DSD (2009)
Hans G. Kerkhoff, Xiao Zhang
Fault co-simulation for test evaluation of heterogeneous integrated biological systems. Microelectron. J. 40 (7) (2009)
Hans G. Kerkhoff, Jarkko J. M. Huijts
Testing of a Highly Reconfigurable Processor Core for Dependable Data Streaming Applications. DELTA (2008)
Oscar Kuiken, Xiao Zhang, Hans G. Kerkhoff
Built-in-Self-Diagnostics for a NoC-Based Reconfigurable IC for Dependable Beamforming Applications. DFT (2008)
Hans G. Kerkhoff, Xiao Zhang, Frédérick Mailly, Pascal Nouet, Hongyuan Liu, Andrew Richardson
A Dependable Micro-Electronic Peptide Synthesizer Using Electrode Data. VLSI Design 2008 (2008)
Hans G. Kerkhoff
Testing Microelectronic Biofluidic Systems. IEEE Des. Test Comput. 24 (1) (2007)
Hans G. Kerkhoff, Xiao Zhang, R. W. Barber, D. R. Emerson
Fault Modelling and Co-Simulation in FlowFET-Based Biological Array Systems. DELTA (2006)
Hans G. Kerkhoff
Testing of MEMS-based microsystems. ETS (2005)
Hans G. Kerkhoff
The test search for true mixed-signal cores. Microelectron. J. 36 (12) (2005)
Hans G. Kerkhoff, Arun A. Joseph
Testability Issues in Superconductor Electronic. DELTA (2004)
Octavian Petre, Hans G. Kerkhoff
Scan Test Strategy for Asynchronous-Synchronous Interfaces. J. Electron. Test. 20 (6) (2004)
M. Stancic, Hans G. Kerkhoff
Testability-analysis driven test-generation of analogue cores. Microelectron. J. 34 (10) (2003)
Arun A. Joseph, Hans G. Kerkhoff
Towards Structural Testing of Superconductor Electronics. ITC (2003)
Hans G. Kerkhoff, Mustafa Acar
Testable Design and Testing of Micro-Electro-Fluidic Arrays. VTS (2003)
Nur Engin, Hans G. Kerkhoff
Fast Fault Simulation for Nonlinear Analog Circuits. IEEE Des. Test Comput. 20 (2) (2003)
Frank te Beest, Ad M. G. Peeters, Kees van Berkel, Hans G. Kerkhoff
Synchronous Full-Scan for Asynchronous Handshake Circuits. J. Electron. Test. 19 (4) (2003)

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Publication Activity (10 Years)

Top Topics

Top Venues

Hans G. Kerkhoff