Investigation of Intermittent Resistive Faults in Digital CMOS Circuits.
Hans G. KerkhoffHassan EbrahimiPublished in: J. Circuits Syst. Comput. (2016)
Keyphrases
- circuit design
- mixed signal
- model based diagnosis
- delay insensitive
- analog vlsi
- high speed
- vlsi circuits
- low power
- digital circuits
- digital forensics
- cmos technology
- fault models
- power consumption
- multi channel
- fault diagnosis
- focal plane
- random access memory
- chip design
- low cost
- floating gate
- low voltage
- abnormal events
- power dissipation
- fault model
- error detection
- fault detection
- test cases
- neural network