Synchronous Full-Scan for Asynchronous Handshake Circuits.

Frank te Beest Ad M. G. Peeters Kees van Berkel Hans G. Kerkhoff

Published in: J. Electron. Test. (2003)

Keyphrases

asynchronous communication
delay insensitive
high level synthesis
asynchronous circuits
shift register
high speed
service composition
scan data
data sets
analog vlsi
vlsi circuits
electronic circuits
tunnel diode
state machines
power dissipation
learning environment
image sequences
image processing
data mining