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Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses.
Shaji Krishnan
Hans G. Kerkhoff
Published in:
IEEE Des. Test (2013)
Keyphrases
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distance metric
data points
metric learning
euclidean distance
distance function
distance metric learning
distance measure
mahalanobis distance
manufacturing process
production planning
product design
nearest neighbor classification
missing data
decision trees
product quality
mass customization