DISTANCE METRIC
Experts
- Jiwen Lu
- Dacheng Tao
- Rong Jin
- Jie Zhou
- Wei-Shi Zheng
- Qi Tian
- Bernard De Baets
- Xuelong Li
- Karsten Roth
- Thomas S. Huang
- Wangmeng Zuo
- Chunhua Shen
- Feiping Nie
- Songcan Chen
- Xilin Chen
- Weihong Deng
- Junlin Hu
- Carlile Lavor
- Björn Ommer
- Lei Wang
- Meng Wang
- Shiguang Shan
- Bo Du
- Yap-Peng Tan
- Qingming Huang
- Jack H. Koolen
- Thomas Seidl
- Ancong Wu
- Changshui Zhang
- Alberto Ravagnani
- Steven C. H. Hoi
- Hong Chang
- Eamonn J. Keogh
- Joachim Gudmundsson
- Sadaaki Miyamoto
- Sariel Har-Peled
- Qi Qian
- Qinghua Hu
- David Zhang
Venues
- CoRR
- IEEE Access
- Pattern Recognit.
- CVPR
- Neurocomputing
- ICASSP
- ICIP
- Pattern Recognit. Lett.
- Discret. Appl. Math.
- AAAI
- Discret. Math.
- Inf. Sci.
- ICPR
- Expert Syst. Appl.
- Multim. Tools Appl.
- IEEE Trans. Inf. Theory
- IJCNN
- ICML
- INTERSPEECH
- ICCV
- Sensors
- IEEE Trans. Image Process.
- NIPS
- IEEE Trans. Pattern Anal. Mach. Intell.
- IJCAI
- IEEE Trans. Neural Networks Learn. Syst.
- Knowl. Based Syst.
- ICDM
- Bioinform.
- Theor. Comput. Sci.
- Appl. Math. Comput.
- Eur. J. Oper. Res.
- J. Intell. Fuzzy Syst.
- Eur. J. Comb.
- Symmetry
- KDD
- IEEE Trans. Circuits Syst. Video Technol.
- ACM Multimedia
- IEEE Trans. Knowl. Data Eng.
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