DISTANCE METRIC LEARNING
Experts
- Jiwen Lu
- Dacheng Tao
- Jie Zhou
- Rong Jin
- Karsten Roth
- Wangmeng Zuo
- Xinwang Liu
- Björn Ommer
- Yong Luo
- Junlin Hu
- Wenzhao Zheng
- Yonggang Wen
- Yap-Peng Tan
- Henning Müller
- Meng Wang
- Minsu Cho
- Steven C. H. Hoi
- Suha Kwak
- Weihong Deng
- Lei Wang
- David Zhang
- Feiping Nie
- Cheng Deng
- Changshui Zhang
- Sungyeon Kim
- Timo Milbich
- Songcan Chen
- Alexandros Kalousis
- William R. Hersh
- Bac Nguyen
- Bernard De Baets
- Jayashree Kalpathy-Cramer
- Qi Qian
- Pengfei Zhu
- En Zhu
- Jun Wang
- Tongliang Liu
- Yaxin Peng
- Barbara Hammer
Venues
- CoRR
- CVPR
- Pattern Recognit.
- IEEE Access
- AAAI
- Neurocomputing
- ICIP
- ICCV
- IJCNN
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- IEEE Trans. Neural Networks Learn. Syst.
- ICPR
- IJCAI
- IEEE Trans. Image Process.
- ICASSP
- Inf. Sci.
- Multim. Tools Appl.
- NIPS
- IEEE Trans. Circuits Syst. Video Technol.
- ICML
- IEEE Trans. Geosci. Remote. Sens.
- ACM Multimedia
- WACV
- Knowl. Based Syst.
- ICME
- IEEE Trans. Cybern.
- KDD
- NeurIPS
- ICDM
- INTERSPEECH
- Expert Syst. Appl.
- IEEE Trans. Knowl. Data Eng.
- IEICE Trans. Inf. Syst.
- IGARSS
- ACM Trans. Intell. Syst. Technol.
- J. Vis. Commun. Image Represent.
- CLEF
- Sensors
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