Intermittent Resistive Faults in Digital CMOS Circuits.
Hans G. KerkhoffHassan EbrahimiPublished in: DDECS (2015)
Keyphrases
- circuit design
- analog vlsi
- mixed signal
- delay insensitive
- model based diagnosis
- high speed
- vlsi circuits
- fault diagnosis
- digital circuits
- low power
- built in self test
- multi channel
- fault detection
- fault models
- cmos technology
- power dissipation
- low voltage
- digital content
- focal plane
- random access memory
- chip design
- cmos image sensor
- power supply
- digital libraries
- infrared
- multiple faults
- low cost
- fuzzy logic