Hans A. R. Manhaeve

Publication Activity (10 Years)

Years Active: 1994-2020
Publications (10 Years): 2

Top Topics

Top Venues

J. Electron. Test.

Publications

Ghazanfar Ali, Leila Bagheriye, Hans A. R. Manhaeve, Hans G. Kerkhoff
On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs. ATS (2020)
Marco Ottavi, Salvatore Pontarelli, Dimitris Gizopoulos, Cristiana Bolchini, Maria K. Michael, Lorena Anghel, Mehdi Baradaran Tahoori, Antonis M. Paschalis, Pedro Reviriego, Oliver Bringmann, Viacheslav Izosimov, Hans A. R. Manhaeve, Christos Strydis, Said Hamdioui
Dependable Multicore Architectures at Nanoscale: The View From Europe. IEEE Des. Test 32 (2) (2015)
Hans A. R. Manhaeve, Pete Harrod, Adit D. Singh, Chintan Patel, Ralf Arnolc, Davide Appello
Current testing: Dead or alive? ETS (2013)
Dimitris Gizopoulos, Said Hamdioui, Hans A. R. Manhaeve
Guest Editorial - Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN). J. Electron. Test. 29 (2) (2013)
Hans A. R. Manhaeve, Esko Mikkola
Semiconductor failure modes and mitigation for critical systems embedded tutorial. ETS (2013)
B. Straka, Hans A. R. Manhaeve, J. Brenkus, Stefaan Kerckenaere
Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality. DATE (2008)
Hans A. R. Manhaeve
The Quest for Test: Will Redundancy Cover All? DDECS (2008)
Hans A. R. Manhaeve
Current Testing for Nanotechnologies: A Demystifying Application Perspective.. Asian Test Symposium (2005)
Hans A. R. Manhaeve
Current testing for nanotechnologies: Myths, facts, and figures. IEEE Des. Test Comput. 21 (3) (2004)
Alessandra Fudoli, Alberto Ascagni, Davide Appello, Hans A. R. Manhaeve
test strategies for deep submicron production test application. Experiences and targets from the field. ETW (2003)
Hans A. R. Manhaeve, Joseph S. Vaccaro, Loren Benecke, David Prystasz
A real world application used to implement a true IDDQ based test strategy (facts and figures). ETW (2002)
Hans A. R. Manhaeve, Stefaan Kerckenaere
An On-Chip Detection Circuit for the Verification of IC Supply Connections. DFT (2001)
Hans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil
Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology. J. Electron. Test. 16 (3) (2000)
Hans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil
Application of supply current testing to analogue circuits, towards a structural analogue test methodology. ETW (1999)
Viera Stopjaková, Hans A. R. Manhaeve, M. Sidiropulos
On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC. DATE (1999)
B. Straka, Hans A. R. Manhaeve, Jozef Vanneuville, M. Svajda
A Fully Digital Controlled Off-Chip IDDQ Measurement Unit. DATE (1998)
M. Svajda, B. Straka, Hans A. R. Manhaeve
IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit. DATE (1998)
M. Svajda, B. Straka, Hans A. R. Manhaeve
A monolithic off-chip IDDQ monitor. ED&TC (1997)
Viera Stopjaková, Hans A. R. Manhaeve
testing of complex CMOS circuits. ED&TC (1997)
Hans A. R. Manhaeve, Paul L. Wrighton, Jos van Sas, Urbain Swerts
Current Measurement Unit for Telecommunication ASICs. ITC (1994)