A Fully Digital Controlled Off-Chip IDDQ Measurement Unit.

B. Straka Hans A. R. Manhaeve Jozef Vanneuville M. Svajda

Published in: DATE (1998)

Keyphrases

correlation analysis
circuit design
high speed
low cost
phase locked loop
high density
cmos image sensor
metadata
vlsi design
analog vlsi
sigma delta
data sets
machine learning
correlation coefficient
digital content
single chip