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Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology.

Hans A. R. ManhaeveJohan VerfaillieB. StrakaJ. P. Cornil
Published in: J. Electron. Test. (2000)
Keyphrases
  • test cases
  • test data
  • high speed
  • application specific
  • database
  • model driven
  • model based testing
  • training set
  • artificial neural networks
  • decision support
  • test data generation
  • item response theory