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testing of complex CMOS circuits.

Viera StopjakováHans A. R. Manhaeve
Published in: ED&TC (1997)
Keyphrases
  • high speed
  • analog vlsi
  • low cost
  • real world
  • circuit design
  • delay insensitive
  • high level
  • complex environments
  • vlsi circuits
  • chip design
  • data sets
  • test cases
  • complex systems
  • power consumption
  • focal plane