Davide Appello

Publication Activity (10 Years)

Years Active: 2001-2024
Publications (10 Years): 26

Top Topics

Confidence Levels

Operating System

Semantically Enriched

Primitive Operations

Top Venues

Publications

Khaled Sidahmed Sidahmed Alamin, Davide Appello, Alessandro Beghi, Nicola Dall'Ora, Fabio Depaoli, Santa Di Cataldo, Franco Fummi, Sebastiano Gaiardelli, Michele Lora, Enrico Macii, Alessio Mascolini, Daniele Pagano, Francesco Ponzio, Gian Antonio Susto, Sara Vinco
An AI-Enabled Framework for Smart Semiconductor Manufacturing. DATE (2024)
Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. IEEE Access 11 (2023)
Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre
A guided debugger-based fault injection methodology for assessing functional test programs. VTS (2023)
Francesco Angione, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. LATS (2023)
Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. DDECS (2023)
Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. IOLTS (2023)
Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Trans. Computers 72 (5) (2023)
F. Angione, Paolo Bernardi, G. Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. ETS (2022)
F. Angione, Davide Appello, J. Aribido, J. Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, C. De Sio, Tommaso Foscale, Gabriele Gavarini, J. Guerrero, M. Huch, Giusy Iaria, T. Kilian, R. Mariani, R. Martone, Annachiara Ruospo, E. Sanchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, L. Sterpone, Vincenzo Tancorre, Roberto Ugioli
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. ETS (2022)
Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. ITC (2022)
Davide Appello, Paolo Bernardi, Andrea Calabrese, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli
Parallel Multithread Analysis of Extremely Large Simulation Traces. IEEE Access 10 (2022)
Giusy Iaria, Tommaso Foscale, Paolo Bernardi, Luca Presicce, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
A novel SEU injection setup for Automotive SoC. ISIE (2022)
Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. LATS (2022)
Francesco Angione, Paolo Bernardi, A. Calabrese, L. Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
An innovative Strategy to Quickly Grade Functional Test Programs. ITC (2022)
Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Claudia Tempesta, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. DFT (2022)
Davide Appello, H. H. Chen, Matthias Sauer, Ilia Polian, Paolo Bernardi, Matteo Sonza Reorda
System-Level Test: State of the Art and Challenges. IOLTS (2021)
Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli
Innovative methods for Burn-In related Stress Metrics Computation. DTIS (2021)
Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Littardi, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. DDECS (2021)
Paolo Bernardi, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, D. Petrali
Applicative System Level Test introduction to Increase Confidence on Screening Quality. DDECS (2020)
F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, G. Zoppi
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. DDECS (2019)
Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. J. Low Power Electron. 14 (1) (2018)
Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini
Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. J. Electron. Test. 34 (1) (2018)
Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez, Federico Venini
An Optimized Test During Burn-In for Automotive SoC. IEEE Des. Test 35 (3) (2018)
Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini
A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. DATE (2017)
Paolo Bernardi, Riccardo Cantoro, L. Gianotto, Marco Restifo, Ernesto Sánchez, Federico Venini, Davide Appello
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. LATS (2017)
Davide Appello, M. Laurino, M. Pranzo
A mathematical model to assess the influence of parallelism in a semiconductor back-end test floor. ITC-Asia (2017)
Hans A. R. Manhaeve, Pete Harrod, Adit D. Singh, Chintan Patel, Ralf Arnolc, Davide Appello
Current testing: Dead or alive? ETS (2013)
Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman
Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? ETS (2013)
Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi
Optimized embedded memory diagnosis. DDECS (2011)
Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli
Adapting to adaptive testing. DATE (2010)
Paolo Rech, Michelangelo Grosso, Fabio Melchiori, D. Loparco, Davide Appello, Luigi Dilillo, Alessandro Paccagnella, Matteo Sonza Reorda
Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. IOLTS (2010)
Nicola Campanelli, Tamas Kerekes, Paolo Bernardi, Mauricio de Carvalho, Alessandro Panariti, Matteo Sonza Reorda, Davide Appello, Mario Barone
Cumulative embedded memory failure bitmap display & analysis. DDECS (2010)
Davide Appello
Safety features of SoCs: How can they be re-used? DDECS (2010)
Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello
Evaluating Alpha-induced soft errors in embedded microprocessors. IOLTS (2009)
Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Sánchez, Matteo Sonza Reorda
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. ETS (2009)
Davide Appello, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda
Effective Diagnostic Pattern Generation Strategy for Transition-Delay Faults in Full-Scan SOCs. IEEE Trans. Very Large Scale Integr. Syst. 17 (11) (2009)
C. Guardiani, A. Shibkov, Angelo Brambilla, Giancarlo Storti Gajani, Davide Appello, Fausto Piazza, Paolo Bernardi
An I-IP based approach for the monitoring of NBTI effects in SoCs. IOLTS (2009)
Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS (2009)
Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso
An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. ETS (2008)
Paolo Bernardi, Fabio Melchiori, Davide Pandini, Santo Pugliese, Davide Appello
Robust Design-for-Productization Practices for High Quality Automotive Products. ITC (2008)
Davide Appello
Automotive IC's: less testing, more prevention. ITC (2007)
Jorge Luis Lagos-Benites, Davide Appello, Paolo Bernardi, Michelangelo Grosso, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda
An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains. DFT (2007)
Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
Embedded Memory Diagnosis: An Industrial Workflow. ITC (2006)
Davide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda
System-in-Package Testing: Problems and Solutions. IEEE Des. Test Comput. 23 (3) (2006)
Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
On the Automation of the Test Flow of Complex SoCs. VTS (2006)
Davide Appello
Session Abstract. VTS (2006)
Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre
Yield Analysis of Logic Circuits. VTS (2004)
Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. J. Electron. Test. 20 (1) (2004)
Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew
Understanding Yield Losses in Logic Circuits. IEEE Des. Test Comput. 21 (3) (2004)
Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante
Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. ITC (2003)
Alessandra Fudoli, Alberto Ascagni, Davide Appello, Hans A. R. Manhaeve
test strategies for deep submicron production test application. Experiences and targets from the field. ETW (2003)
Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello
High Accuracy Stimulus Generation for A/D Converter BIST. ITC (2002)
Davide Appello
The Yield of Test Outsourcing. ITC (2002)
Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. MTDT (2002)
Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. IOLTW (2002)
Davide Appello, Fulvio Corno, M. Giovinetto, Maurizio Rebaudengo, Matteo Sonza Reorda
A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis. Asian Test Symposium (2001)