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Automatic Functional Stress Pattern Generation for SoC Reliability Characterization.

Davide AppelloPaolo BernardiR. CagliesiM. GiancarliniMichelangelo GrossoEdgar E. SánchezMatteo Sonza Reorda
Published in: ETS (2009)
Keyphrases
  • pattern generation
  • fully automatic
  • genetic algorithm
  • knowledge base
  • expert systems
  • semi automatic
  • swarm robots
  • neural network
  • data mining
  • path planning
  • reliability analysis
  • functional analysis