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Automatic Functional Stress Pattern Generation for SoC Reliability Characterization.
Davide Appello
Paolo Bernardi
R. Cagliesi
M. Giancarlini
Michelangelo Grosso
Edgar E. Sánchez
Matteo Sonza Reorda
Published in:
ETS (2009)
Keyphrases
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pattern generation
fully automatic
genetic algorithm
knowledge base
expert systems
semi automatic
swarm robots
neural network
data mining
path planning
reliability analysis
functional analysis