Aubin Roy

Publication Activity (10 Years)

Years Active: 1999-2012
Publications (10 Years): 0

Top Topics

Feature Vectors

Software Testing

Top Venues

IEEE Des. Test Comput.

Publications

Stephen K. Sunter, Aubin Roy
Contactless Test of IC Pads, Pins, and TSVs via Standard Boundary Scan. IEEE Des. Test Comput. 29 (5) (2012)
Stephen K. Sunter, Aubin Roy
Adaptive parametric BIST of high-speed parallel I/Os via standard boundary scan. ITC (2011)
Stephen K. Sunter, Aubin Roy
A Mixed-Signal Test Bus and Analog BIST with 'Unlimited' Time and Voltage Resolution. ETS (2011)
Stephen K. Sunter, Aubin Roy
Noise-Insensitive Digital BIST for any PLL or DLL. J. Electron. Test. 24 (5) (2008)
Stephen K. Sunter, Aubin Roy
A selt-testing BOST for high-frequency PLLs, DLLs, and SerDes. ITC (2007)
Stephen K. Sunter, Aubin Roy
Purely Digital BIST for Any PLL or DLL. ETS (2007)
Stephen K. Sunter, Aubin Roy
Testing SerDes beyond 4 Gbps - changing priorities. CICC (2007)
Stephen K. Sunter, Aubin Roy
Structural Tests for Jitter Tolerance in SerDes Receivers. ITC (2006)
Stephen K. Sunter, Aubin Roy
Structural tests for jitter tolerance in SerDes receivers. ITC (2005)
Stephen K. Sunter, Aubin Roy, Jean-Francois Cote
An Automated, Complete, Structural Test Solution for SERDES. ITC (2004)
Stephen K. Sunter, Aubin Roy
On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz. IEEE Des. Test Comput. 21 (4) (2004)
Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello
High Accuracy Stimulus Generation for A/D Converter BIST. ITC (2002)
Stephen K. Sunter, Aubin Roy
BIST for phase-locked loops in digital applications. ITC (1999)