On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz.

Stephen K. Sunter Aubin Roy

Published in: IEEE Des. Test Comput. (2004)

Keyphrases

circuit design
high speed
low cost
cmos image sensor
mixed signal
low power
high density
digital media
dynamic range
data acquisition
programmable logic
phase locked loop
end to end
single chip
high bandwidth
vlsi implementation
evolvable hardware
analog vlsi
metadata