A Mixed-Signal Test Bus and Analog BIST with 'Unlimited' Time and Voltage Resolution.

Stephen K. Sunter Aubin Roy

Published in: ETS (2011)

Keyphrases

mixed signal
low power
multi channel
low voltage
vlsi circuits
high speed
ieee bus
built in self test
digital circuits
power system
cmos technology
power consumption
low cost
high resolution
digital signal processing
single chip
wireless sensor networks
analog to digital converter
parallel processing
real time