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Contactless Test of IC Pads, Pins, and TSVs via Standard Boundary Scan.

Stephen K. SunterAubin Roy
Published in: IEEE Des. Test Comput. (2012)
Keyphrases
  • smart card
  • machine learning
  • test cases
  • real time
  • artificial intelligence
  • website
  • real world
  • computer vision
  • information systems
  • video sequences
  • feature vectors
  • edge map
  • test suite
  • software testing