Alberto Pagani

Publication Activity (10 Years)

Years Active: 2014-2022
Publications (10 Years): 7

Top Topics

Evolutionary Algorithm

Special Features

Radio Frequency Identification Rfid

Top Venues

IEEE Trans. Circuits Syst. II Express Briefs

J. Low Power Electron.

Publications

Lorella Bordogna, Fabio Brembilla, Alberto Pagani, Marco Spinetta
New R&R Methodology in Semiconductor Manufacturing Electrical Testing. ITC (2022)
Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Giuseppe Palmisano
A fully contactless wafer-level testing for UHF RFID tag with on-chip antenna. DTIS (2018)
Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Giuseppe Palmisano
Main Parasitic Effects in Contactless Wafer Testing. ApplePies (2018)
Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. J. Low Power Electron. 14 (1) (2018)
Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Egidio Ragonese, Giuseppe Palmisano
Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas. IEEE Trans. Circuits Syst. II Express Briefs (10) (2018)
Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini
A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. DATE (2017)
Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser
Thermal issues in test: An overview of the significant aspects and industrial practice. VTS (2016)
Antoine Reverdy, M. Marchetti, Allesandra Fudoli, Alberto Pagani, V. Goubier, M. Cason, Jesse Alton, Martin Igarashi, G. Gibbons
Electro Optical Terahertz Pulse Reflectometry, a non destructive technique to localize defects on various type of package. Microelectron. Reliab. 54 (9-10) (2014)