Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas.
Alessandro FinocchiaroGiovanni GirlandoAlessandro MottaAlberto PaganiEgidio RagoneseGiuseppe PalmisanoPublished in: IEEE Trans. Circuits Syst. II Express Briefs (2018)
Keyphrases
- rfid tags
- low cost
- radio frequency identification
- rfid systems
- lightweight
- security level
- cost effective
- rfid technology
- rfid reader
- power consumption
- security protocols
- public key
- smart card
- radio frequency identification rfid
- security issues
- process control
- security mechanisms
- embedded systems
- mobile terminals
- computer simulation
- real time