Alessandro Motta

Publication Activity (10 Years)

Years Active: 2016-2024
Publications (10 Years): 12

Top Topics

Semantic Segmentation

Top Venues

IEEE Trans. Circuits Syst. II Express Briefs

Int. J. Comput. Assist. Radiol. Surg.

Publications

Ahmad Bin Qasim, Alessandro Motta, Alexander Studier-Fischer, Jan Sellner, Leonardo Ayala, Marco Hübner, Marc Bressan, Berkin Özdemir, Karl-Friedrich Kowalewski, Felix Nickel, Silvia Seidlitz, Lena Maier-Hein
Test-time augmentation with synthetic data addresses distribution shifts in spectral imaging. Int. J. Comput. Assist. Radiol. Surg. 19 (6) (2024)
Jan Sellner, Silvia Seidlitz, Alexander Studier-Fischer, Alessandro Motta, Berkin Özdemir, Beat Peter Müller-Stich, Felix Nickel, Lena Maier-Hein
Semantic Segmentation of Surgical Hyperspectral Images Under Geometric Domain Shifts. MICCAI (9) (2023)
Elisabetta Palumbo, Alessandro Motta, Elisa Petroni, Daniele Gallinari, Annalisa Gilardini, Amos Galbiati, Massimo Borghi, Roberto Annunziata, Andrea Redaelli
ePCM reliability improvement through active material carbon implantation. ESSDERC (2023)
Jan Sellner, Silvia Seidlitz, Alexander Studier-Fischer, Alessandro Motta, Berkin Özdemir, Beat Peter Müller-Stich, Felix Nickel, Lena Maier-Hein
Semantic segmentation of surgical hyperspectral images under geometric domain shifts. CoRR (2023)
Giovanni Livraga, Alessandro Motta, Marco Viviani
Assessing User Privacy on Social Media: The Twitter Case Study. OASIS@HT (2022)
Matteo Baldo, Lorenzo Turconi, Alessandro Motta, Elisa Petroni, Luca Laurin, Daniele Ielmini, Andrea Redaelli
Characterization of reset state through energy activation study in Ge-GST based ePCM. ESSDERC (2022)
Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Giuseppe Palmisano
A fully contactless wafer-level testing for UHF RFID tag with on-chip antenna. DTIS (2018)
Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Giuseppe Palmisano
Main Parasitic Effects in Contactless Wafer Testing. ApplePies (2018)
Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. J. Low Power Electron. 14 (1) (2018)
Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Egidio Ragonese, Giuseppe Palmisano
Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas. IEEE Trans. Circuits Syst. II Express Briefs (10) (2018)
Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini
A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. DATE (2017)
Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser
Thermal issues in test: An overview of the significant aspects and industrial practice. VTS (2016)