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Main Parasitic Effects in Contactless Wafer Testing.

Alessandro FinocchiaroGiovanni GirlandoAlessandro MottaAlberto PaganiGiuseppe Palmisano
Published in: ApplePies (2018)
Keyphrases
  • smart card
  • integrated circuit
  • information systems
  • information retrieval
  • social networks
  • decision making
  • case study
  • hidden markov models
  • main features