Sign in
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study.
Davide Appello
Paolo Bernardi
Simone Gerardin
Michelangelo Grosso
Alessandro Paccagnella
Paolo Rech
Matteo Sonza Reorda
Published in:
VTS (2009)
Keyphrases
</>
low cost
infrared
x ray
real time
discrete fourier transform
case study
learning objects
test set
frequency domain
low power
highly efficient
tool support
single chip
software reuse
digital camera
data acquisition
face recognition
e learning