Alessandro Paccagnella

Publication Activity (10 Years)

Years Active: 2003-2023
Publications (10 Years): 11

Top Topics

Bias Variance Decomposition

Earth Observation

Geometrical Properties

Top Venues

MetroInd4.0&IoT

Publications

Elisabetta Pasqualotto, Erica Cretaio, Lara Franchin, Alessandro De Toni, Alessandro Paccagnella, Stefano Bonaldo, Matteo Scaramuzza
SPECTRA: A Novel Compact System for Surface Plasmon Resonance Measurements. Sensors 23 (9) (2023)
Sarah Tonello, Tiziano Fapanni, Stefano Bonaldo, Giada Giorgi, Claudio Narduzzi, Alessandro Paccagnella, Mauro Serpelloni, Emilio Sardini, Sandro Carrara
Amperometric Measurements by a Novel Aerosol Jet Printed Flexible Sensor for Wearable Applications. IEEE Trans. Instrum. Meas. 72 (2023)
Stefano Bonaldo, Lara Franchin, Erica Cretaio, Elisabetta Pasqualotto, Matteo Scaramuzza, Alessandro Paccagnella
Electrochemical Biosensor for Timely Detection of Lactococcus Lactis Bacteriophage in Milk Samples. SENSORS (2023)
Stefano Bonaldo, Sarah Tonello, Lara Franchin, Arben Merkoçi, Giulio Rosati, Alessandro Paccagnella
Multiphysics simulations of screen-printed electrodes for electrochemical biosensing. MetroInd4.0&IoT (2023)
Giulia Cisotto, Giulio Rosati, Alessandro Paccagnella
A simple and accessible inkjet platform for ultra-short concept-to-prototype sEMG electrodes production. EMBC (2019)
Federica Resta, Simone Gerardin, S. Mattiazzo, Alessandro Paccagnella, Marcello De Matteis, Christian C. Enz, Andrea Baschirotto
1GigaRad TID impact on 28 nm HEP analog circuits. Integr. 63 (2018)
Giulio Rosati, Matteo Scaramuzza, Elisabetta Pasqualotto, Alessandro De Toni, Alessandro Paccagnella
Optimization of Cyclic Voltammetric Curve Parameters to Measure Lactate Concentration in Urine Samples. Sensors (2016)
Daniele Rossi, Martin Omaña, Cecilia Metra, Alessandro Paccagnella
Impact of Bias Temperature Instability on Soft Error Susceptibility. IEEE Trans. Very Large Scale Integr. Syst. 23 (4) (2015)
Charalambos M. Andreou, Alessandro Paccagnella, Diego González Castaño, Faustino Gómez Rodríguez, Valentino Liberali, Alexander V. Prokofiev, Cristiano Calligaro, Arto Javanainen, Ari Virtanen, Daniel Nahmad, Julius Georgiou
A subthreshold, low-power, RHBD reference circuit, for earth observation and communication satellites. ISCAS (2015)
N. Demaria, G. Dellacasa, G. Mazza, Angelo Rivetti, Manuel D. Da Rocha Rolo, E. Monteil, L. Pacher, Fabio Ciciriello, Francesco Corsi, Cristoforo Marzocca, G. De Roberts, F. Loddo, C. Tamma, Marta Bagatin, D. Bisello, Simone Gerardin, S. Mattiazzo, L. Ding, Piero Giubilato, Alessandro Paccagnella, Francesco De Canio, Luigi Gaioni, Massimo Manghisoni, Valerio Re, Gianluca Traversi, E. Riceputi, Lodovico Ratti, C. Vacchi, Roberto Beccherle, Guido Magazzù, M. Minuti, F. Morsani, Fabrizio Palla, Valentino Liberali, Seyedruhollah Shojaii, Alberto Stabile, Gian Mario Bilei, M. Menichelli, Elia Conti, Sara Marconi, D. Passen, Pisana Placidi
CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments. IWASI (2015)
Paola Zuppella, Elisabetta Pasqualotto, Sara Zuccon, Francesca Gerlin, Alain Jody Corso, Matteo Scaramuzza, Alessandro De Toni, Alessandro Paccagnella, Maria Guglielmina Pelizzo
Palladium on Plastic Substrates for Plasmonic Devices. Sensors 15 (1) (2015)
Isabella Rossetto, Fabiana Rampazzo, Simone Gerardin, Matteo Meneghini, Marta Bagatin, Alberto Zanandrea, Alessandro Paccagnella, Gaudenzio Meneghesso, Enrico Zanoni, Christian Dua, Marie-Antoinette di Forte-Poisson, Raphael Aubry, Mourad Oualli, Sylvain L. Delage
Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences. ESSDERC (2014)
Giovanni Bruni, Paolo Rech, Lucas A. Tambara, Gabriel L. Nazar, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis, Alessandro Paccagnella
Power dissipation effects on 28nm FPGA-based System on Chips neutron sensitivity. VLSI-SoC (2014)
M. Bagatin, Simone Gerardin, Alessandro Paccagnella, C. Andreani, Giuseppe Gorini, C. D. Frost
Temperature dependence of neutron-induced soft errors in SRAMs. Microelectron. Reliab. 52 (1) (2012)
Matteo Scaramuzza, Alberto Ferrario, Elisabetta Pasqualotto, Giulio Rosati, Alessandro De Toni, Marco Quarta, Alessandro Paccagnella, Carlo Reggiani
Low-cost Enzyme-based Biosensor for Lactic Acid Amperometric Detection - Electrical Modeling and Validation for Clinical and Food Processing Applications. BIODEVICES (2012)
Cristiana Bolchini, Antonio Miele, Chiara Sandionigi, Marco Ottavi, Salvatore Pontarelli, Adelio Salsano, Cecilia Metra, Martin Omaña, Daniele Rossi, Matteo Sonza Reorda, Luca Sterpone, Massimo Violante, Simone Gerardin, M. Bagatin, Alessandro Paccagnella
High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies. DFT (2012)
Daniele Rossi, Martin Omaña, Cecilia Metra, Alessandro Paccagnella
Impact of Aging Phenomena on Soft Error Susceptibility. DFT (2011)
M. Bagatin, Simone Gerardin, Alessandro Paccagnella, G. Cellere, F. Irom, D. N. Nguyen
Destructive events in NAND Flash memories irradiated with heavy ions. Microelectron. Reliab. 50 (9-11) (2010)
Paolo Rech, Michelangelo Grosso, Fabio Melchiori, D. Loparco, Davide Appello, Luigi Dilillo, Alessandro Paccagnella, Matteo Sonza Reorda
Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. IOLTS (2010)
Simone Gerardin, M. Bagatin, Alessandro Paccagnella, G. Cellere, Angelo Visconti, M. Bonanomi
Impact of total dose on heavy-ion upsets in floating gate arrays. Microelectron. Reliab. 50 (9-11) (2010)
Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello
Evaluating Alpha-induced soft errors in embedded microprocessors. IOLTS (2009)
Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS (2009)
Niccolò Battezzati, Simone Gerardin, Andrea Manuzzato, Alessandro Paccagnella, Sana Rezgui, Luca Sterpone, Massimo Violante
On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs. IOLTS (2008)
Andrea Cester, A. Gasperin, Nicola Wrachien, Alessandro Paccagnella, Valentina Ancarani, Cosimo Gerardi
Ionising radiation and electrical stress on nanocrystal memory cell array. Microelectron. Reliab. 47 (4-5) (2007)
M. Bagatin, G. Cellere, Simone Gerardin, Alessandro Paccagnella, Angelo Visconti, Silvia Beltrami, M. Maccarrone
Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. IOLTS (2007)
Andrea Manuzzato, Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Luca Sterpone, Massimo Violante
Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs. DFT (2007)
Javier Martín-Martínez, Simone Gerardin, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Andrea Cester, Alessandro Paccagnella, G. Ghidini
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. Microelectron. Reliab. 47 (9-11) (2007)
G. Cellere, Alessandro Paccagnella, Angelo Visconti, M. Bonanomi
Erratic Effects of Irradiation in Floating Gate Memory Cells. IOLTS (2006)
Simone Gerardin, Alessio Griffoni, Andrea Cester, Alessandro Paccagnella, G. Ghidini
Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. Microelectron. Reliab. 46 (9-11) (2006)
Francesca Danesin, Franco Zanon, Simone Gerardin, Fabiana Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella
Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. Microelectron. Reliab. 46 (9-11) (2006)
Monica Alderighi, A. Candelori, Fabio Casini, Sergio D'Angelo, Marcello Mancini, Alessandro Paccagnella, Sandro Pastore, Giacomo R. Sechi
Heavy Ion Effects on Configuration Logic of Virtex FPGAs. IOLTS (2005)
G. Cellere, Alessandro Paccagnella, Angelo Visconti, M. Bonanomi
Soft Errors induced by single heavy ions in Floating Gate memory arrays. DFT (2005)
M. Bellato, Paolo Bernardi, D. Bortolato, A. Candelori, M. Ceschia, Alessandro Paccagnella, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, P. Zambolin
Evaluating the Effects of SEUs Affecting the Configuration Memory of an SRAM-Based FPGA. DATE (2004)
Massimo Violante, M. Ceschia, Matteo Sonza Reorda, Alessandro Paccagnella, Paolo Bernardi, Maurizio Rebaudengo, D. Bortolato, M. Bellato, P. Zambolin, A. Candelori
Analyzing SEU Effects in SRAM-based FPGAs. IOLTS (2003)
S. Cimino, Andrea Cester, Alessandro Paccagnella, G. Ghidini
Ionising radiation effects on MOSFET drain current. Microelectron. Reliab. 43 (8) (2003)