M. Bagatin

Publication Activity (10 Years)

Years Active: 2007-2012
Publications (10 Years): 0

Top Topics

Error Accumulation

Design Methodologies

Top Venues

Microelectron. Reliab.

Publications

M. Bagatin, Simone Gerardin, Alessandro Paccagnella, C. Andreani, Giuseppe Gorini, C. D. Frost
Temperature dependence of neutron-induced soft errors in SRAMs. Microelectron. Reliab. 52 (1) (2012)
Cristiana Bolchini, Antonio Miele, Chiara Sandionigi, Marco Ottavi, Salvatore Pontarelli, Adelio Salsano, Cecilia Metra, Martin Omaña, Daniele Rossi, Matteo Sonza Reorda, Luca Sterpone, Massimo Violante, Simone Gerardin, M. Bagatin, Alessandro Paccagnella
High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies. DFT (2012)
M. Bagatin, Simone Gerardin, Alessandro Paccagnella, G. Cellere, F. Irom, D. N. Nguyen
Destructive events in NAND Flash memories irradiated with heavy ions. Microelectron. Reliab. 50 (9-11) (2010)
Simone Gerardin, M. Bagatin, Alessandro Paccagnella, G. Cellere, Angelo Visconti, M. Bonanomi
Impact of total dose on heavy-ion upsets in floating gate arrays. Microelectron. Reliab. 50 (9-11) (2010)
M. Bagatin, G. Cellere, Simone Gerardin, Alessandro Paccagnella, Angelo Visconti, Silvia Beltrami, M. Maccarrone
Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. IOLTS (2007)