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High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies.

Cristiana BolchiniAntonio MieleChiara SandionigiMarco OttaviSalvatore PontarelliAdelio SalsanoCecilia MetraMartin OmañaDaniele RossiMatteo Sonza ReordaLuca SterponeMassimo ViolanteSimone GerardinM. BagatinAlessandro Paccagnella
Published in: DFT (2012)
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