Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs.
Javier Martín-MartínezSimone GerardinRosana RodríguezMontserrat NafríaXavier AymerichAndrea CesterAlessandro PaccagnellaG. GhidiniPublished in: Microelectron. Reliab. (2007)
Keyphrases
- analog circuits
- low voltage
- fault diagnosis
- digital circuits
- physical characteristics
- neural network
- accurate estimation
- knowledge base
- fuzzy logic
- knowledge acquisition
- wavelet packet transform
- finite state machines
- estimation algorithm
- hidden markov models
- control system
- decision making
- artificial intelligence
- genetic algorithm
- data mining