PHYSICAL CHARACTERISTICS
Experts
- S. J. Ben Yoo
- Sudeep Pasricha
- Paul R. Prucnal
- Indrajit Kurmi
- Oliver Bimber
- Ishan G. Thakkar
- Nicola Andriolli
- Volker J. Sorger
- Hiroyuki Kajimoto
- Keren Bergman
- Peter Bienstman
- David C. Schedl
- Charis Mesaritakis
- Hamza Kurt
- Mohammad Soroosh
- Dimitris Syvridis
- Vishal Saxena
- Samuel Palermo
- Nicola Calabretta
- Hiroshi Maeda
- Wolfgang Freude
- David V. Plant
- Nikos Pleros
- Christian Koos
- Sebastian Randel
- Joris Van Campenhout
- David J. Richardson
- Shinji Matsuo
- Mahdi Nikdast
- Shilong Pan
- Marialena Akriotou
- Atsushi Uchida
- Rui Wang
- Matthias Blaicher
- Masaya Notomi
- Yusuke Ogura
- Kengo Nozaki
- Kestutis Staliunas
- Kuniyuki Kakushima
Venues
- OFC
- CoRR
- Sensors
- ICTON
- EMBC
- IEEE Access
- Microelectron. Reliab.
- ECOC
- IEICE Trans. Electron.
- Photonic Netw. Commun.
- IEEE Trans. Instrum. Meas.
- Microelectron. J.
- Proc. IEEE
- OECC/PSC
- IEEE Trans. Biomed. Eng.
- OFC/NFOEC
- IEEE SENSORS
- IEEE Commun. Mag.
- I2MTC
- IEEE J. Sel. Areas Commun.
- IEICE Electron. Express
- ISCAS
- Remote. Sens.
- Quantum Inf. Process.
- IAS
- NEMS
- ISSCC
- MIPRO
- IECON
- SIAM J. Appl. Math.
- IEEE J. Solid State Circuits
- IEEE Trans. Commun.
- Sci. China Inf. Sci.
- Medical Biol. Eng. Comput.
- IEEE Trans. Geosci. Remote. Sens.
- IEICE Trans. Commun.
- PSC
- MWSCAS
- BioCAS
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